TY - GEN
T1 - Systematic Literature Review
T2 - 41st IEEE Central America and Panama Convention, CONCAPAN 2023
AU - Navarro Cedeno, Gabriel Omar
AU - Moya, Katherine Cortes
AU - Dormond, Ahmed Somarribas
AU - Gonzalez-Torres, Antonio
AU - Rojas-Hernandez, Yenory
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - This article presents a systematic review of the literature on the use of machine learning for software fault prediction. The objective of the paper is to determine how machine learning algorithms have been used in the approach of models for this type of prediction. The analysis carried out contemplates 52 articles that were published between 2009 and 2022. The study covers the categorization of the algorithms based on the way they were used in the applications. The results showed that the most used algorithms are based on supervised learning, Support Vector Machine (SVM), Random Forest and Naive Bayes; however, the most effective prediction models used a combination of different algorithms.
AB - This article presents a systematic review of the literature on the use of machine learning for software fault prediction. The objective of the paper is to determine how machine learning algorithms have been used in the approach of models for this type of prediction. The analysis carried out contemplates 52 articles that were published between 2009 and 2022. The study covers the categorization of the algorithms based on the way they were used in the applications. The results showed that the most used algorithms are based on supervised learning, Support Vector Machine (SVM), Random Forest and Naive Bayes; however, the most effective prediction models used a combination of different algorithms.
KW - algorithms
KW - Deep learning
KW - defect prediction
KW - error prediction
KW - fault prediction
KW - machine learning
KW - neural networks
KW - software
UR - http://www.scopus.com/inward/record.url?scp=85193260616&partnerID=8YFLogxK
U2 - 10.1109/CONCAPANXLI59599.2023.10517566
DO - 10.1109/CONCAPANXLI59599.2023.10517566
M3 - Contribución a la conferencia
AN - SCOPUS:85193260616
T3 - Proceeding of the 2023 IEEE 41st Central America and Panama Convention, CONCAPAN XLI 2023
BT - Proceeding of the 2023 IEEE 41st Central America and Panama Convention, CONCAPAN XLI 2023
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 8 November 2023 through 10 November 2023
ER -