TY - GEN
T1 - Including stripline connections into network parameter based via models for fast simulation of interconnects
AU - Rimolo-Donadio, Renato
AU - Brüns, Heinz Dietrich
AU - Schuster, Christian
PY - 2009
Y1 - 2009
N2 - Comprehensive physics-based via models are extended to consider traces connecting vias in PCB and package structures (stripline connection). The traces routed between two power planes are described by modal decomposition to account for the contribution of the parallel plate mode and the stripline mode. The analytical formulation for two vias connected by a trace is provided in this work. It results in a fully parameterized 4-port network, formed by the parallel connection of four 4-by-4 admittance matrices corresponding to: the parallel plate mode, the stripline mode, a coupling factor resulting from the superposition of the two modes, and the capacitances between the via barrel and the power planes. With this novel formulation, good correlation with respect to full-wave simulations could be observed up to 20 GHz, with a remarkable improvement on the computation speed (up to three orders of magnitude).
AB - Comprehensive physics-based via models are extended to consider traces connecting vias in PCB and package structures (stripline connection). The traces routed between two power planes are described by modal decomposition to account for the contribution of the parallel plate mode and the stripline mode. The analytical formulation for two vias connected by a trace is provided in this work. It results in a fully parameterized 4-port network, formed by the parallel connection of four 4-by-4 admittance matrices corresponding to: the parallel plate mode, the stripline mode, a coupling factor resulting from the superposition of the two modes, and the capacitances between the via barrel and the power planes. With this novel formulation, good correlation with respect to full-wave simulations could be observed up to 20 GHz, with a remarkable improvement on the computation speed (up to three orders of magnitude).
UR - http://www.scopus.com/inward/record.url?scp=64249108550&partnerID=8YFLogxK
U2 - 10.1109/EMCZUR.2009.4783461
DO - 10.1109/EMCZUR.2009.4783461
M3 - Contribución a la conferencia
AN - SCOPUS:64249108550
SN - 9783952328668
T3 - Proceedings of the 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
SP - 345
EP - 348
BT - Proceedings of the 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
T2 - 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
Y2 - 12 January 2009 through 16 January 2009
ER -