Extraction of broadband error boxes for microprobes and recessed probe launches for measurement of printed circuit board structures

Miroslav Kotzev, Renato Rimolo-Donadio, Christian Schuster

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

8 Citas (Scopus)

Resumen

This paper presents results for the error boxes (two-port scattering parameters) of ground-signal-ground (GSG) mini-coaxial probes (microprobes) and recessed probe launches up to 20 GHz. The recessed probe launch uses internal GSG pads for the access of embedded printed circuit board (PCB) structures without the need for signal vias. The error boxes were obtained by using two-tier calibration techniques where the first tier was based on short-open-load-through (SOLT) and the second tier on short-open-load (SOL) or through-reflect-line (TRL) calibration algorithms. Results from different calibration set ups are compared with each other and agree well. The obtained error boxes can be used for deembedding or analysis of the microprobe and probe launch performance.

Idioma originalInglés
Título de la publicación alojada2009 IEEE Workshop on Signal Propagation on Interconnects, SPI '09
DOI
EstadoPublicada - 2009
Publicado de forma externa
Evento2009 IEEE Workshop on Signal Propagation on Interconnects, SPI '09 - Strasbourg, Francia
Duración: 12 may 200915 may 2009

Serie de la publicación

Nombre2009 IEEE Workshop on Signal Propagation on Interconnects, SPI '09

Conferencia

Conferencia2009 IEEE Workshop on Signal Propagation on Interconnects, SPI '09
País/TerritorioFrancia
CiudadStrasbourg
Período12/05/0915/05/09

Huella

Profundice en los temas de investigación de 'Extraction of broadband error boxes for microprobes and recessed probe launches for measurement of printed circuit board structures'. En conjunto forman una huella única.

Citar esto