Evaluation of vector fitting for compact interconnect model representation

Luis Ernesto Carrera-Retana, Renato Rimolo-Donadio, Christian Schuster

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

3 Citas (Scopus)

Resumen

In this work, we present a study on the utilization of vector fitting as a compression technique for storing passive interconnect model data for multiport systems. A canonical transmission line case and three different modeling examples from the literature are explored, where the error is compared as a function of the number of poles used to extract the rational approximation. The compression ratio for data storage with respect to conventional S-Parameter models is discussed as well. It will be shown that the compression ratio is highly dependent of the electrical length of the configuration and the type of response; however, ratios over 5 could be obtained for all the cases when using a number of poles that guarantees a maximum mean relative error below 1%.

Idioma originalInglés
Título de la publicación alojada2016 IEEE 36th Central American and Panama Convention, CONCAPAN 2016
EditorialInstitute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)9781467395786
DOI
EstadoPublicada - 2 jul 2016
Evento36th IEEE Central American and Panama Convention, CONCAPAN 2016 - San Jose, Costa Rica
Duración: 9 nov 201611 nov 2016

Serie de la publicación

Nombre2016 IEEE 36th Central American and Panama Convention, CONCAPAN 2016

Conferencia

Conferencia36th IEEE Central American and Panama Convention, CONCAPAN 2016
País/TerritorioCosta Rica
CiudadSan Jose
Período9/11/1611/11/16

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