TY - GEN
T1 - Defect inspection and detection in solar panels using image sensing technology
T2 - 14th International Multi-Conference on Complexity, Informatics and Cybernetics, IMCIC 2023
AU - Méndez-Porras, Abel
AU - Alfaro-Velasco, Jorge
AU - Jiménez-Delgado, Efren
N1 - Publisher Copyright:
© 2023 Proceedings IMCIC - International Multi-Conference on Complexity, Informatics and Cybernetics.
PY - 2023
Y1 - 2023
N2 - The use of photovoltaic technologies quickly became popular. Defects that affect power generation in solar panels have been identified. It's well known that external conditions can affect the performance of solar panels. As its use becomes more widespread, mechanisms are needed to keep it working optimally. We performed a systematic mapping study of the published literature and included 171 papers. This study identified the approaches and techniques that the literature has addressed to defect inspection and detection in solar panels using image sensing technology. The use of computer systems and image analysis technologies to detect faults or external factors that affect the operation of photovoltaic panels, represent efficient alternatives to reduce time, personnel dedicated to inspections and increase efficiency in fault detection.
AB - The use of photovoltaic technologies quickly became popular. Defects that affect power generation in solar panels have been identified. It's well known that external conditions can affect the performance of solar panels. As its use becomes more widespread, mechanisms are needed to keep it working optimally. We performed a systematic mapping study of the published literature and included 171 papers. This study identified the approaches and techniques that the literature has addressed to defect inspection and detection in solar panels using image sensing technology. The use of computer systems and image analysis technologies to detect faults or external factors that affect the operation of photovoltaic panels, represent efficient alternatives to reduce time, personnel dedicated to inspections and increase efficiency in fault detection.
KW - Artificial Intelligence (AI)
KW - Defect Detection
KW - Image Processing
KW - Luminescence
KW - Photovoltaic Modules
KW - Thermography
UR - http://www.scopus.com/inward/record.url?scp=85173600445&partnerID=8YFLogxK
U2 - 10.54808/IMCIC2023.01.64
DO - 10.54808/IMCIC2023.01.64
M3 - Contribución a la conferencia
AN - SCOPUS:85173600445
T3 - Proceedings IMCIC - International Multi-Conference on Complexity, Informatics and Cybernetics
SP - 64
EP - 71
BT - IMCIC 2023 - 14th International Multi-Conference on Complexity, Informatics and Cybernetics, Proceedings
A2 - Callaos, Nagib C.
A2 - Hashimoto, Shigehiro
A2 - Lace, Natalja
A2 - Sanchez, Belkis
A2 - Savoie, Michael
PB - International Institute of Informatics and Cybernetics
Y2 - 28 March 2023 through 31 March 2023
ER -