A combined method for fast analysis of signal propagation, ground noise, and radiated emission of multilayer printed circuit boards

Xiaomin Duan, Renato Rimolo-Donadio, Heinz Dietrich Brüns, Christian Schuster

Producción científica: Contribución a una revistaArtículorevisión exhaustiva

43 Citas (Scopus)

Resumen

This paper presents a method for fast and comprehensive simulation of signal propagation, power/ground noise, and radiated emissions by combining the merits of the physics-based via model, the modal decomposition technique, the contour integral method (CIM), and the equivalence principle. The physics-based via model combined with the modal decomposition technique is an efficient technique for signal integrity analysis of multilayer PCBs and packages. The CIM can be used to calculate the voltage distribution between arbitrarily shaped power planes. Far-field radiation can be obtained by applying the field equivalence principle. In this paper, we integrate the four techniques to analyze all the three effects in a fast, concurrent, and holistic manner. To the best knowledge of the authors, the four techniques are integrated here for the first time. Various structures are simulated and validated with full-wave simulations up to 20 GHz. It is shown that a reduction in simulation time of more than two orders of magnitude is achieved in comparison to a standard full-wave electromagnetic solver.

Idioma originalInglés
Número de artículo5422640
Páginas (desde-hasta)487-495
Número de páginas9
PublicaciónIEEE Transactions on Electromagnetic Compatibility
Volumen52
N.º2
DOI
EstadoPublicada - may 2010
Publicado de forma externa

Huella

Profundice en los temas de investigación de 'A combined method for fast analysis of signal propagation, ground noise, and radiated emission of multilayer printed circuit boards'. En conjunto forman una huella única.

Citar esto