TY - JOUR
T1 - A combined method for fast analysis of signal propagation, ground noise, and radiated emission of multilayer printed circuit boards
AU - Duan, Xiaomin
AU - Rimolo-Donadio, Renato
AU - Brüns, Heinz Dietrich
AU - Schuster, Christian
PY - 2010/5
Y1 - 2010/5
N2 - This paper presents a method for fast and comprehensive simulation of signal propagation, power/ground noise, and radiated emissions by combining the merits of the physics-based via model, the modal decomposition technique, the contour integral method (CIM), and the equivalence principle. The physics-based via model combined with the modal decomposition technique is an efficient technique for signal integrity analysis of multilayer PCBs and packages. The CIM can be used to calculate the voltage distribution between arbitrarily shaped power planes. Far-field radiation can be obtained by applying the field equivalence principle. In this paper, we integrate the four techniques to analyze all the three effects in a fast, concurrent, and holistic manner. To the best knowledge of the authors, the four techniques are integrated here for the first time. Various structures are simulated and validated with full-wave simulations up to 20 GHz. It is shown that a reduction in simulation time of more than two orders of magnitude is achieved in comparison to a standard full-wave electromagnetic solver.
AB - This paper presents a method for fast and comprehensive simulation of signal propagation, power/ground noise, and radiated emissions by combining the merits of the physics-based via model, the modal decomposition technique, the contour integral method (CIM), and the equivalence principle. The physics-based via model combined with the modal decomposition technique is an efficient technique for signal integrity analysis of multilayer PCBs and packages. The CIM can be used to calculate the voltage distribution between arbitrarily shaped power planes. Far-field radiation can be obtained by applying the field equivalence principle. In this paper, we integrate the four techniques to analyze all the three effects in a fast, concurrent, and holistic manner. To the best knowledge of the authors, the four techniques are integrated here for the first time. Various structures are simulated and validated with full-wave simulations up to 20 GHz. It is shown that a reduction in simulation time of more than two orders of magnitude is achieved in comparison to a standard full-wave electromagnetic solver.
KW - Contour integral method (CIM)
KW - Field equivalence principle
KW - Physics-based via and trace model
KW - Power integrity (PI)
KW - Printed circuit board (PCB)
KW - Signal integrity (SI)
UR - http://www.scopus.com/inward/record.url?scp=77952742370&partnerID=8YFLogxK
U2 - 10.1109/TEMC.2010.2041238
DO - 10.1109/TEMC.2010.2041238
M3 - Artículo
AN - SCOPUS:77952742370
SN - 0018-9375
VL - 52
SP - 487
EP - 495
JO - IEEE Transactions on Electromagnetic Compatibility
JF - IEEE Transactions on Electromagnetic Compatibility
IS - 2
M1 - 5422640
ER -