Defect inspection and detection in solar panels using image sensing technology: A Systematic Mapping Study

Abel Méndez-Porras, Jorge Alfaro-Velasco, Efren Jiménez-Delgado

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The use of photovoltaic technologies quickly became popular. Defects that affect power generation in solar panels have been identified. It's well known that external conditions can affect the performance of solar panels. As its use becomes more widespread, mechanisms are needed to keep it working optimally. We performed a systematic mapping study of the published literature and included 171 papers. This study identified the approaches and techniques that the literature has addressed to defect inspection and detection in solar panels using image sensing technology. The use of computer systems and image analysis technologies to detect faults or external factors that affect the operation of photovoltaic panels, represent efficient alternatives to reduce time, personnel dedicated to inspections and increase efficiency in fault detection.

Original languageEnglish
Title of host publicationIMCIC 2023 - 14th International Multi-Conference on Complexity, Informatics and Cybernetics, Proceedings
EditorsNagib C. Callaos, Shigehiro Hashimoto, Natalja Lace, Belkis Sanchez, Michael Savoie
PublisherInternational Institute of Informatics and Cybernetics
Pages64-71
Number of pages8
ISBN (Electronic)9781950492718
DOIs
StatePublished - 2023
Event14th International Multi-Conference on Complexity, Informatics and Cybernetics, IMCIC 2023 - Virtual, Online
Duration: 28 Mar 202331 Mar 2023

Publication series

NameProceedings IMCIC - International Multi-Conference on Complexity, Informatics and Cybernetics
Volume2023-March
ISSN (Print)2771-5914
ISSN (Electronic)2771-5922

Conference

Conference14th International Multi-Conference on Complexity, Informatics and Cybernetics, IMCIC 2023
CityVirtual, Online
Period28/03/2331/03/23

Keywords

  • Artificial Intelligence (AI)
  • Defect Detection
  • Image Processing
  • Luminescence
  • Photovoltaic Modules
  • Thermography

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